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1

Volunteer Motivation and Organizational Climate: Factors that Promote Satisfaction and Sustained Volunteerism in NPOs

Nencini, Alessio, Romaioli, Diego, Meneghini, Anna Maria

Journal:

Voluntas: International Journal of Voluntary and Nonprofit Organizations

Année:

2016

Langue:

english

Fichier:

PDF, 529 KB

english, 2016

2

[Integrated Circuits and Systems] Gallium Nitride-enabled High Frequency and High Efficiency Power Conversion || Taking the Next Step in GaN: Bulk GaN Substrates and GaN-on-Si Epitaxy for Electronics

Meneghesso, Gaudenzio, Meneghini, Matteo, Zanoni, Enrico

Année:

2018

Langue:

english

Fichier:

PDF, 619 KB

english, 2018

3

Tourniquetless Total Knee Arthroplasty: History, Controversies, and Technique

Stronach, Benjamin M., Jones, Richard E., Meneghini, R. Michael

Journal:

Journal of the American Academy of Orthopaedic Surgeons

Année:

2021

Fichier:

PDF, 750 KB

2021

4

Numerical investigation of the flow around two circular cylinders in tandem

B.S. Carmo, J.R. Meneghini

Journal:

Journal of Fluids and Structures

Année:

2006

Langue:

english

Fichier:

PDF, 451 KB

english, 2006

5

Safety of once-daily insulin detemir in patients with type 2 diabetes treated with oral hypoglycemic agents in routine clinical practice (在常规临床实践中使用口服降糖药治疗的2型糖尿病患者每日一次使用地特胰岛素治疗的安全性)

Ross, Stuart, Dzida, Grzegorz, Ji, Qiuhe, Kaiser, Marcel, Ligthelm, Robert, Meneghini, Luigi, Nazeri, Avideh, Orozco-Beltran, Domingo, Pan, Changyu, Svendsen, Anne Louise

Journal:

Journal of Diabetes

Année:

2014

Langue:

english

Fichier:

PDF, 254 KB

english, 2014

6

[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Reliability and failure analysis in power GaN-HEMTs: An overview

Meneghini, Matteo, Rossetto, Isabella, De Santi, Carlo, Rampazzo, Fabiana, Tajalli, Alaleh, Barbato, Alessandro, Ruzzarin, Maria, Borga, Matteo, Canato, Eleonora, Zanoni, Enrico, Meneghesso, Gaudenzio

Année:

2017

Langue:

english

Fichier:

PDF, 653 KB

english, 2017

7

Integrated Modeling of Tokamak Experiments with OMFIT

MENEGHINI, Orso, LAO, Lang

Journal:

Plasma and Fusion Research

Année:

2013

Langue:

english

Fichier:

PDF, 1.15 MB

english, 2013

8

Technology readiness assessment of ultra-deep salt caverns for carbon capture and storage in Brazil

Goulart, Mariana Barbero Ribeiro, Costa, Pedro Vassalo Maia da, Costa, Alvaro Maia da, Miranda, Antonio C.O., Mendes, Andre Bergsten, Ebecken, Nelson F.F., Meneghini, Julio R., Nishimoto, Kazuo, Assi,

Journal:

International Journal of Greenhouse Gas Control

Année:

2020

Fichier:

PDF, 19.19 MB

2020

9

The processes of underthrusting and underplating in the geologic record: structural diversity between the Franciscan Complex (California), the Kodiak Complex (Alaska) and the Internal Ligurian Units (Italy)

F. Meneghini, M. Marroni, J.C. Moore, L. Pandolfi, C.D. Rowe

Journal:

Geological Journal

Année:

2009

Langue:

english

Fichier:

PDF, 1.52 MB

english, 2009

10

NUMERICAL SIMULATION OF FLOW INTERFERENCE BETWEEN TWO CIRCULAR CYLINDERS IN TANDEM AND SIDE-BY-SIDE ARRANGEMENTS

J.R. MENEGHINI, F. SALTARA, C.L.R. SIQUEIRA, J.A. FERRARI JR

Journal:

Journal of Fluids and Structures

Année:

2001

Langue:

english

Fichier:

PDF, 836 KB

english, 2001

11

An ancient navis oneraria with the myth of Odysseus and the Sirens represented on a late Roman sherd

Roberto Meneghini, Archer Martin

Journal:

International Journal of Nautical Archaeology

Année:

1983

Langue:

english

Fichier:

PDF, 2.52 MB

english, 1983

12

GEMSTONES FROM VIGNA BARBERINI AT THE PALATINE HILL (ROME, ITALY)*

E. GLIOZZO, N. GRASSI, P. BONANNI, C. MENEGHINI, M. A. TOMEI

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 939 KB

english, 2011

13

Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives

Meneghesso, G., Verzellesi, G., Danesin, F., Rampazzo, F., Zanon, F., Tazzoli, A., Meneghini, M., Zanoni, E.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 1.27 MB

english, 2008

14

On the wake-induced vibration of tandem circular cylinders: the vortex interaction excitation mechanism

ASSI, G. R. S., BEARMAN, P. W., MENEGHINI, J. R.

Journal:

Journal of Fluid Mechanics

Année:

2010

Langue:

english

Fichier:

PDF, 5.08 MB

english, 2010

15

Trapping phenomena in AlGaN/GaN HEMTs: a study based on pulsed and transient measurements

Meneghesso, Gaudenzio, Meneghini, Matteo, Bisi, Davide, Rossetto, Isabella, Cester, Andrea, Mishra, Umesh K, Zanoni, Enrico

Journal:

Semiconductor Science and Technology

Année:

2013

Langue:

english

Fichier:

PDF, 1.24 MB

english, 2013

16

Extensive Investigation of Time-Dependent Breakdown of GaN-HEMTs Submitted to OFF-State Stress

Meneghini, Matteo, Rossetto, Isabella, Hurkx, Fred, Sonsky, Jan, Croon, Jeroen A., Meneghesso, Gaudenzio, Zanoni, Enrico

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.82 MB

english, 2015

17

Time-Dependent Failure of GaN-on-Si Power HEMTs With p-GaN Gate

Rossetto, Isabella, Meneghini, Matteo, Hilt, Oliver, Bahat-Treidel, Eldad, De Santi, Carlo, Dalcanale, Stefano, Wuerfl, Joachim, Zanoni, Enrico, Meneghesso, Gaudenzio

Journal:

IEEE Transactions on Electron Devices

Année:

2016

Langue:

english

Fichier:

PDF, 1.73 MB

english, 2016

18

How to Foster Commitment Among Volunteers: A Social Constructionist Study in Italian Nonprofit Organizations

Romaioli, Diego, Nencini, Alessio, Meneghini, Anna Maria

Journal:

Journal of Social Service Research

Année:

2016

Langue:

english

Fichier:

PDF, 505 KB

english, 2016

19

Field-Related Failure of GaN-on-Si HEMTs: Dependence on Device Geometry and Passivation

Rossetto, I., Meneghini, M., Pandey, S., Gajda, M., Hurkx, G. A. M., Croon, J. A., Sonsky, J., Meneghesso, G., Zanoni, E.

Journal:

IEEE Transactions on Electron Devices

Année:

2016

Langue:

english

Fichier:

PDF, 1.92 MB

english, 2016

20

Failure of High Power LEDs Submitted to EOS: Dependence on Device Layout and Pulse Properties

Buffolo, Matteo, Meneghini, Matteo, Munaretto, Andrea, De Santi, Carlo, Meneghesso, Gaudenzio, Zanoni, Enrico

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2017

Langue:

english

Fichier:

PDF, 1.15 MB

english, 2017

21

Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits

Buffolo, M., Pietrobon, M., De Santi, C., Samparisi, F., Davenport, M.L., Bowers, J.E., Meneghesso, G., Zanoni, E., Meneghini, M.

Journal:

Microelectronics Reliability

Année:

2018

Langue:

english

Fichier:

PDF, 830 KB

english, 2018

22

Life-Course Criminal Trajectories of Mafia Members

Campedelli, Gian Maria, Calderoni, Francesco, Comunale, Tommaso, Meneghini, Cecilia

Journal:

Crime & Delinquency

Année:

2019

Langue:

english

Fichier:

PDF, 336 KB

english, 2019

23

Assessing motivation for change toward healthy nutrition and regular physical activity. Validation of two sets of instruments

Valter Spiller, Maurizio Scaglia, Stefania Meneghini, Angiola Vanzo

Journal:

Mediterranean Journal of Nutrition and Metabolism

Année:

2009

Langue:

english

Fichier:

PDF, 153 KB

english, 2009

24

Reliability analysis of InGaN Blu-Ray laser diode

Nicola Trivellin, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda

Journal:

Microelectronics Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 534 KB

english, 2009

25

Degradation mechanisms of high-power white LEDs activated by current and temperature

M. Dal Lago, M. Meneghini, N. Trivellin, G. Meneghesso, E. Zanoni

Journal:

Microelectronics Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 743 KB

english, 2011

26

Chip and package-related degradation of high power white LEDs

Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 1.09 MB

english, 2012

27

Application of the Braunbek method to the Maggi–Rubinowicz field representation

Meneghini, Robert

Journal:

Journal of the Optical Society of America

Année:

1983

Langue:

english

Fichier:

PDF, 733 KB

english, 1983

28

Reliability issues in GaN-based light-emitting diodes: Effect of dc and PWM stress

M. Meneghini, M. Dal Lago, L. Rodighiero, N. Trivellin, E. Zanoni, G. Meneghesso

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 519 KB

english, 2012

29

[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - GaN-HEMTs devices with single- and double-heterostructure for power switching applications

Meneghesso, G., Zanandrea, A., Stocco, A., Rossetto, I., De Santi, C., Rampazzo, F., Meneghini, M., Zanoni, E., Bahat-Treidel, E., Hilt, O., Ivo, P., Wuerfl, J.

Année:

2013

Langue:

english

Fichier:

PDF, 1.04 MB

english, 2013

30

Comparison of the performances of an InAlN/GaN HEMT with a Mo/Au gate or a Ni/Pt/Au gate

Rossetto, I., Rampazzo, F., Silvestri, R., Zanandrea, A., Dua, C., Delage, S., Oualli, M., Meneghini, M., Zanoni, E., Meneghesso, G.

Journal:

Microelectronics Reliability

Année:

2013

Langue:

english

Fichier:

PDF, 684 KB

english, 2013

31

Ultrasonography in myofascial neck pain: randomized clinical trial for diagnosis and follow-up

Stecco, Antonio, Meneghini, Andrea, Stern, Robert, Stecco, Carla, Imamura, Marta

Journal:

Surgical and Radiologic Anatomy

Année:

2014

Langue:

english

Fichier:

PDF, 1.39 MB

english, 2014

32

Trapping and Reliability Assessment in D-Mode GaN-Based MIS-HEMTs for Power Applications

Meneghini, Matteo, Bisi, Davide, Marcon, Denis, Stoffels, Steve, Van Hove, Marleen, Wu, Tian-Li, Decoutere, Stefaan, Meneghesso, Gaudenzio, Zanoni, Enrico

Journal:

IEEE Transactions on Power Electronics

Année:

2014

Langue:

english

Fichier:

PDF, 823 KB

english, 2014

33

First Reliability Demonstration of Sub-200-nm AlN/GaN-on-Silicon Double-Heterostructure HEMTs for Ka-Band Applications

Meneghesso, Gaudenzio, Meneghini, Matteo, Medjdoub, Farid, Tagro, Yoann, Grimbert, Bertrand, Ducatteau, Damien, Rolland, Nathalie, Silvestri, Riccardo, Zanoni, Enrico

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2013

Langue:

english

Fichier:

PDF, 1.17 MB

english, 2013

34

Failure signatures on 0.25μm GaN HEMTs for high-power RF applications

Stocco, A., Dalcanale, S., Rampazzo, F., Meneghini, M., Meneghesso, G., Grünenpütt, J., Lambert, B., Blanck, H., Zanoni, E.

Journal:

Microelectronics Reliability

Année:

2014

Langue:

english

Fichier:

PDF, 498 KB

english, 2014

35

Breakdown mechanisms in AlGaN/GaN HEMTs: An overview

Meneghesso, Gaudenzio, Meneghini, Matteo, Zanoni, Enrico

Journal:

Japanese Journal of Applied Physics

Année:

2014

Langue:

english

Fichier:

PDF, 1.76 MB

english, 2014

36

Performance Degradation of High-Brightness Light Emitting Diodes Under DC and Pulsed Bias

Buso, S., Spiazzi, G., Meneghini, M., Meneghesso, G.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 804 KB

english, 2008

37

Determination of Ethanol Concentration by Raman Spectroscopy in Liquid-Core Microstructured Optical Fiber

Meneghini, Chiara, Caron, Serge, Poulin, Anne Claire Jacob, Proulx, Antoine, Emond, FrÉdÉric, Paradis, Patrick, Pare, Claude, Fougeres, AndrÉ

Journal:

IEEE Sensors Journal

Année:

2008

Langue:

english

Fichier:

PDF, 606 KB

english, 2008

38

Influence of Shunt Resistance on the Performance of an Illuminated String of Solar Cells: Theory, Simulation, and Experimental Analysis

Barbato, M., Meneghini, M., Cester, A., Mura, G., Zanoni, E., Meneghesso, G.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2014

Langue:

english

Fichier:

PDF, 2.05 MB

english, 2014

39

Temperature-Dependent Dynamic $R_{\mathrm {\mathrm{{\scriptstyle ON}}}}$ in GaN-Based MIS-HEMTs: Role of Surface Traps and Buffer Leakage

Meneghini, Matteo, Vanmeerbeek, Piet, Silvestri, Riccardo, Dalcanale, Stefano, Banerjee, Abhishek, Bisi, Davide, Zanoni, Enrico, Meneghesso, Gaudenzio, Moens, Peter

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.05 MB

english, 2015

40

[IEEE 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Budapest, Hungary (2015.4.19-2015.4.22)] 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Impact of solder-joint tilting on the reliability of LED-based PCB assemblies: A combined experimental and FEM analysis

Vandevelde, Bart, Zanon, Franco, Griffoni, Alessio, Li, Xiaolong, Willems, Geert, Meneghini, Matteo

Année:

2015

Langue:

english

Fichier:

PDF, 1.99 MB

english, 2015

41

Experimental Comparison of Two Degrees-of-Freedom Vortex-Induced Vibration on High and Low Aspect Ratio Cylinders with Small Mass Ratio

Gonçalves, Rodolfo T., Rosetti, Guilherme F., Fujarra, André L. C., Franzini, Guilherme R., Freire, César M., Meneghini, Julio R.

Journal:

Journal of Vibration Acoustics Stress and Reliability in Design

Année:

2012

Langue:

english

Fichier:

PDF, 2.21 MB

english, 2012

42

[IEEE 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Hong Kong, China (2015.5.10-2015.5.14)] 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - On the impact of carbon-doping on the dynamic Ron and off-state leakage current of 650V GaN power devices

Moens, P., Vanmeerbeek, P., Banerjee, A., Guo, J., Liu, C., Coppens, P., Salih, A., Tack, M., Caesar, M., Uren, M. J., Kuball, M., Meneghini, M., Meneghesso, G., Zanoni, E.

Année:

2015

Langue:

english

Fichier:

PDF, 635 KB

english, 2015

43

[ASME ASME 2014 Conference on Smart Materials, Adaptive Structures and Intelligent Systems - Newport, Rhode Island, USA (Monday 8 September 2014)] Volume 2: Mechanics and Behavior of Active Materials; Integrated System Design and Implementation; Bioinspired Smart Materials and Systems; Energy Harvesting - Development of Biomechanical Knee Force Model for Evaluation of Piezoelectric Sensors for In-Vivo Monitoring

Wilson, Brooke E., Anton, Steven R., Meneghini, R. Michael

Année:

2014

Langue:

english

Fichier:

PDF, 1.55 MB

english, 2014

44

On-Wafer Single-Pulse Thermal Load–Pull RF Characterization of Trapping Phenomena in AlGaN/GaN HEMTs

Benvegnu, Agostino, Laurent, Sylvain, Meneghini, Matteo, Barataud, Denis, Meneghesso, Gaudenzio, Zanoni, Enrico, Quere, Raymond

Journal:

IEEE Transactions on Microwave Theory and Techniques

Année:

2016

Langue:

english

Fichier:

PDF, 2.06 MB

english, 2016

45

Degradation of UV-A LEDs: Physical Origin and Dependence on Stress Conditions

Monti, Desiree, Meneghini, Matteo, De Santi, Carlo, Meneghesso, Gaudenzio, Zanoni, Enrico

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2016

Langue:

english

Fichier:

PDF, 1.23 MB

english, 2016

46

Muscle Damage During MIS Total Hip Arthroplasty

Meneghini, R Michael, Pagnano, Mark W, Trousdale, Robert T, Hozack, William J

Journal:

Clinical Orthopaedics and Related Research®

Année:

2006

Langue:

english

Fichier:

PDF, 365 KB

english, 2006

47

[Power Electronics and Power Systems] Power GaN Devices || Gate Injection Transistors: E-mode Operation and Conductivity Modulation

Meneghini, Matteo, Meneghesso, Gaudenzio, Zanoni, Enrico

Année:

2017

Langue:

english

Fichier:

PDF, 1.93 MB

english, 2017

48

Flavanones: Citrus phytochemical with health-promoting properties

Barreca, Davide, Gattuso, Giuseppe, Bellocco, Ersilia, Calderaro, Antonella, Trombetta, Domenico, Smeriglio, Antonella, Laganà, Giuseppina, Daglia, Maria, Meneghini, Silvia, Nabavi, Seyed Mohammad

Journal:

Année:

2017

Langue:

english

Fichier:

PDF, 574 KB

english, 2017

49

Trapping phenomena and degradation mechanisms in GaN-based power HEMTs

Meneghini, Matteo, Tajalli, Alaleh, Moens, Peter, Banerjee, Abhishek, Zanoni, Enrico, Meneghesso, Gaudenzio

Journal:

Materials Science in Semiconductor Processing

Année:

2017

Langue:

english

Fichier:

PDF, 2.80 MB

english, 2017

50

Using ideas and methodologies from other authors without proper referencing is a form of plagiarism!

Rabozzi, Roberto, Oricco, Stefano, Meneghini, Caterina, Franci, Paolo

Journal:

Veterinary Radiology & Ultrasound

Année:

2018

Langue:

english

Fichier:

PDF, 109 KB

english, 2018